InstrumentOperational

S-Parameters Measurement Bench

Vectorial network analyzer bench for high-frequency electronics testing, RF component characterization and electromagnetic material analysis. Presented during the LEEC inauguration.

Location

LEEC Laboratory

Technical Specifications

S-parameter measurements, high-frequency RF testing

Usage & Applications

Characterization of RF components, antennas and microwave circuits (S11, S21, S12, S22 parameters).
Electromagnetic material analysis and high-frequency dielectric measurements.
Validation of energy harvesting rectenna designs and wireless power transfer prototypes.
Educational demonstrations for postgraduate RF/microwave courses.

How to request access:

Contact the lab director. Training session required before unsupervised use. Booking via the equipment calendar for sessions of up to 3 hours.

Interested in using this equipment?

Contact the Laboratory of Electrotechnical Engineering to request access or schedule a measurement session with our research team.